Description:
Scanning Electron
Characterization of surfaces of materials: – Easy Probe, a compact scanning electron microscope (SEM) fully integrated with a selected energy dispersive X-ray microanalyser (EDX).
Technical Specifications:
- Electron Gun: Tungsten heated cathode
- Magnification: 3x to 1,000,000x (for 5’’ image width in Continual Wide Field/Resolution)
- Maximum Field of View: 24 mm at WD 30 mm
- Accelerating Voltage: 200 V to 30 kV
- Probe Current: 1 pA to 2 µA
- Scanning Speed: From 20 ns to 10 ms per pixel adjustable in steps or continuously
Scanning Features:
- Point & Line Scan, Focus Window – shape, size and position continuously adjustable, Dynamic Focus – in plane or folded plane tilted up to ±70
- Deg, Image rotation, Image shift, Tilt compensation, 3D Beam –defined tilting scanning axis around XY axis, Live Stereoscopic Imaging, Other scanning shapes available through the Draw Beam software
Image File format:
- BMP, TIFF, JPEG (Selectable)
Control:
- Computer (PC) interface
Accessories:
- Computer, LCD Display